University of Oxford, United Kingdom

Department of Materials, University of Oxford, UK

Dr. John Sykes, expert in corrosion and other areas of chemical metallurgy, will lead the team's Network research and training activities at Oxford Department of Materials.

Ph.D. (Metallurgy), Cambridge University 1968, FRSC, MIM, MICorr, C.Eng. he was a Senior Lecturer at Sunderland Polytechnic (1971-8), Senior Research Fellow and Lecturer at Oxford since 1978 is now University Reader at Oxford and Tutor at Mansfield College, Oxford. He has chaired the Corrosion Science Division, Institute of Corrosion and the Corrosion Committee, Institute of Materials.  He is a member of the the editorial board for Corrosion Engineering Science and Technology.

Dr. John Hutchison is a specialist in all areas of transmission electron microscopy, particularly high resolution microscopy. Ph.D. (Chemistry) Glasgow 1970.

Positions held: Oxford University: Inorganic Chemistry Laboratory 1970 -75; University of Wales, Aberystwyth: Chemistry Department 1975-78; University of Oxford: Department of Materials, Research Fellow (1978-79); EPSRC Advanced Fellow (1979-85) Senior Research Fellow (1985-1996); Research Lecturer (1997-99); Present position: Reader in Materials (1999 - present) In charge of HREM facilities. Committees: Electron Microscopy & Analysis Group (Institute of Physics) (1975-78); Steering Committee, Cambridge High Resolution Electron Microscope; Project (1978 -1984); SERC Working Party for Cambridge HREM Project (1978); Royal Microscopical Society: Executive Secretary (1996 – 2001);Vice-President (2001); President (2002 - 2004); Vice-President & International Secretary (2004-present); European Microscopy Society: Executive Board (2000 - 2004).

Editorial Boards: Micron & Journal of Microscopy

Experimental facilities: State-of-the art electron microscopy facilities will be available for this project, including a high resolution, 400 kilovolt instrument (JEOL 4000EX) and an ultra-high resolution, analytical field-emission-gun instrument (JEOL 3000F). Both instruments are equipped with digital image recording for on-line image analysis and processing, also facilitating rapid electronic transfer of images and other data to collaborators.

Hutchison JL, Titchmarsh JM, Cockayne DJH, Doole RC, Hetherington CJD, Kirkland AI, Sawada H,"A versatile double aberration-corrected, energy filtered HREM/STEM for materials science", Ultramicroscopy, 103, 7-15, Apr 2005

Li CM, Robertson IM, Jenkins ML, Hutchison JL, Doole RC,"In situ TEM observation of the nucleation and growth of silver oxide nanoparticles", MICRON 36 (1): 9-15, 2005

Ishii Y and Sykes JM, "Microstructure of oxide layers formed in air at 450oC", Materials at High Temperatures, 17, 23-28, 2000.

Contact:

Dr. John Sykes
University of Oxford
Department of Materials
Parks Road OX1 3PH
Oxford
United Kingdom

Phone +44 (1865) 273726
Fax +44 (1865) 273789

http://www.materials.ox.ac.uk/