European Synchrotron Facility, Grenoble, France

The ESRF was the first of the world's three 3rd generation synchrotrons, and is the world leader in many fields, in particular high-energy diffraction. The ESRF employs over 150 scientists and an equal number of engineers and technicians, and over 3500 researchers visit each year to conduct experiments. The ID11 beamline is the flagship for materials science research at the ESRF and is the site of the current 3DXRD microscope. The success of this instrument has led to the financing of an extension to the beamline, which will make it the world's first facility for high-energy nano-focussing. Numerous spatially and temporally resolved studies have been carried out on ID11 and elsewhere at the ESRF, notably in the context of participation in European HRM networks, including some covering hydrogen storage, for which a in-situ sorption/desorption can be carried out.

Dr. Gavin Vaughan is an expert in applications of diffraction methods in Materials Science. He obtained his Ph.D in Physics, for which he was awarded the Eli Burnstein award, from the University of Pennsylvania, after which he moved to the ESRF. He is now scientist responsible for the ID11 beamline, leading a group of 11 scientists and engineers. He has worked over a large range of scientific topics in crystallography, solid state chemistry, physics and materials science, and is the author of > 90 refereed or invited articles, which have been cited over 1400 times in the last 15 years. He has done leading work in the fields of time-resolved, single crystal, and high resolution powder diffraction, and has instigated the construction and development of the high energy diffraction nanoscope facility at the ESRF, for which he is scientific responsible.

Experimental facilities: Unparalleled facilities for high-energy X-ray diffraction and tomography; TEM; SEM; DTA/TGA; a wide range of sample environments for in-situ diffraction studies, including in situ H2 loading facilities; furnaces, cryogenic sample environments, tension and high pressure apparatuses, in-situ Raman probes.

D. Juul Jensen, E.M. Lauridsen, L. Margulies, H.F. Poulsen, S. Schmidt, H.O. Sørensen and G.B.M. Vaughan, X-ray microscopy in four dimensions, Materials Today, 9, 18, January-February 2006,

M. Morcrette, Y. Chabre, G. Vaughan, G. Amatucci, J. -B. Leriche, S. Patoux, C. Masquelier and J-M. Tarascon, In situ X-ray diffraction techniques as a powerful tool to study battery electrode materials, Electrochimica Acta, Volume 47, 3137 (2002).

A. R. Yavari, J. F. R. de Castro, G. Vaughan and G. Heunen, Structural evolution and metastable phase detection in MgH2-5%NbH nanocomposite during in-situ H-desorption in a synchrotron beam, Journal of Alloys and Compounds, Volume 353, 246 (2003).

Contact

Dr. Gavin Vaughan
ESRF
Materials Science Group - ID11 Materials Science Beamline
B.P. 220
F-38043 Grenoble cedex
France

Phone +33 (4) 76 88 23 41
Fax +33 (4) 76 88 27 07

http://www.esrf.fr/UsersAndScience/Experiments/MaterialsScience/ID11/